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KS8695X

Electronics Part Number

KS8695X-WX
KS8695X

Description

Integrated 10/100 Ethernet Switch, 208-PQFP

Inventory

420 Pcs New Original In Stock
10/100 integrated switch, 208-PQFP 28x28; multi-port capability; managed switching systems.
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Basic cost: USD 70.00

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Shipped from Hong Kong via FedEx/DHL/UPS/TNT

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Technical Specifications

Category Diodes, RF Diodes

Manufacturer MACOM Technology Solutions

Packaging -

Operating Temperature -40°C ~ 125°C (TJ)

Package / Case Die

Series -

Base Product Number MA4E2502

Product Status Active

Supplier Device Package Die

Current - Max 20 mA

Power Dissipation (Max) 50 mW

Diode Type Schottky

Capacitance @ Vr, F 0.12pF @ 0V, 18GHz

Voltage - Peak Reverse (Max) 5V

Resistance @ If, F -

Data Sheet Document (D)

Datasheets Download MA4E2502L-1246 Product Specification (PDF)

HTML Datasheet MA4E2502L-1246-DG

Environmental & Export Classification

RoHS Status ROHS3 Compliant

Moisture Sensitivity Level (MSL) 1 (Unlimited)

ECCN EAR99

HTSUS 8541.10.0060

Additional Information

Other Names 1465-1028

Standard Package 100

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Frequently Asked Questions (FAQ)

FAQ Icon

When designing a high-frequency RF detector circuit above 10 GHz, how does the MA4E2502L-1246 compar

The MA4E2502L-1246 offers superior capacitance stability with only 0.12pF at 0V and minimal variation under reverse bias, making it more predictable than the SMS7630-079LF, whose capacitance can shift significantly with applied voltage. This stability reduces impedance drift in matching networks at frequencies above 10 GHz, minimizing the need for tunable components. For broadband or temperature-variable environments, the MA4E2502L-1246 simplifies design by maintaining consistent reactive behavior, lowering the risk of VSWR degradation in sensitive detector or mixer stages.
FAQ Icon

Can the MA4E2502L-1246 be used as a drop-in replacement for the MA4E1317 in a 24 GHz radar front-end

While both are Schottky diodes from MACOM, the MA4E2502L-1246 is not a direct drop-in for the MA4E1317 due to differences in die geometry and parasitic inductance. The MA4E2502L-1246 has lower capacitance (0.12pF vs. ~0.3pF) and different bond pad layout, requiring re-optimization of transmission line impedance and ground return paths. To mitigate RF performance degradation, reduce bond wire lengths and use grounded coplanar waveguide structures. Re-simulate the matching network using EM tools, as even minor inductance changes can detune the 24 GHz response.
FAQ Icon

What are the key thermal and reliability risks when operating the MA4E2502L-1246 near its 50 mW powe

Operating the MA4E2502L-1246 near 50 mW in a sealed, low-airflow environment risks thermal runaway due to limited heat dissipation through the die alone. Without a thermal pad, junction temperature must be estimated using the thermal resistance from junction to case (RθJC), which for bare die is typically high (>500°C/W). Use infrared thermography on the substrate or apply power derating above 85°C ambient. To mitigate failure, limit average power to <30 mW in enclosed systems and ensure low thermal resistance mounting with conductive epoxy or direct eutectic bonding.
FAQ Icon

In a zero-bias detector application at 18 GHz, how does the MA4E2502L-1246’s zero-bias resistance co

The MA4E2502L-1246 exhibits higher zero-bias resistance than the HSMS-286C, resulting in lower junction conductance and improved sensitivity for weak signal detection at 18 GHz. However, this also increases susceptibility to RF burnout and reduces linearity under strong signal conditions. For low-level detection (e.g., -30 dBm and below), the MA4E2502L-1246 provides better SNR, but in high-dynamic-range systems, consider adding a limiter or attenuator to protect the diode. Always validate with load-pull analysis to optimize termination impedance for maximum sensitivity.
FAQ Icon

What precautions are needed when handling and assembling the MA4E2502L-1246 bare die in a hybrid mic

Despite its MSL 1 (unlimited floor life), the MA4E2502L-1246 is highly sensitive to ESD due to its 5V peak reverse voltage and nanoscale junction. Use Class 0 ESD controls: grounded workstations, ionizers, and conductive tweezers during die placement. Avoid triboelectric charging during handling—never use plastic trays or non-conductive probes. Perform assembly in a <100 V HBM environment and consider on-wafer testing before final integration. Post-assembly, apply a conformal coating to prevent moisture-induced leakage, even though the part is not moisture-sensitive, to protect bond wires and edges.
FAQ Icon

When designing a high-frequency RF detector circuit above 10 GHz, how does the MA4E2502L-1246 compar

The MA4E2502L-1246 offers superior capacitance stability with only 0.12pF at 0V and minimal variation under reverse bias, making it more predictable than the SMS7630-079LF, whose capacitance can shift significantly with applied voltage. This stability reduces impedance drift in matching networks at frequencies above 10 GHz, minimizing the need for tunable components. For broadband or temperature-variable environments, the MA4E2502L-1246 simplifies design by maintaining consistent reactive behavior, lowering the risk of VSWR degradation in sensitive detector or mixer stages.
FAQ Icon

Can the MA4E2502L-1246 be used as a drop-in replacement for the MA4E1317 in a 24 GHz radar front-end

While both are Schottky diodes from MACOM, the MA4E2502L-1246 is not a direct drop-in for the MA4E1317 due to differences in die geometry and parasitic inductance. The MA4E2502L-1246 has lower capacitance (0.12pF vs. ~0.3pF) and different bond pad layout, requiring re-optimization of transmission line impedance and ground return paths. To mitigate RF performance degradation, reduce bond wire lengths and use grounded coplanar waveguide structures. Re-simulate the matching network using EM tools, as even minor inductance changes can detune the 24 GHz response.
FAQ Icon

What are the key thermal and reliability risks when operating the MA4E2502L-1246 near its 50 mW powe

Operating the MA4E2502L-1246 near 50 mW in a sealed, low-airflow environment risks thermal runaway due to limited heat dissipation through the die alone. Without a thermal pad, junction temperature must be estimated using the thermal resistance from junction to case (RθJC), which for bare die is typically high (>500°C/W). Use infrared thermography on the substrate or apply power derating above 85°C ambient. To mitigate failure, limit average power to <30 mW in enclosed systems and ensure low thermal resistance mounting with conductive epoxy or direct eutectic bonding.
FAQ Icon

In a zero-bias detector application at 18 GHz, how does the MA4E2502L-1246’s zero-bias resistance co

The MA4E2502L-1246 exhibits higher zero-bias resistance than the HSMS-286C, resulting in lower junction conductance and improved sensitivity for weak signal detection at 18 GHz. However, this also increases susceptibility to RF burnout and reduces linearity under strong signal conditions. For low-level detection (e.g., -30 dBm and below), the MA4E2502L-1246 provides better SNR, but in high-dynamic-range systems, consider adding a limiter or attenuator to protect the diode. Always validate with load-pull analysis to optimize termination impedance for maximum sensitivity.
FAQ Icon

What precautions are needed when handling and assembling the MA4E2502L-1246 bare die in a hybrid mic

Despite its MSL 1 (unlimited floor life), the MA4E2502L-1246 is highly sensitive to ESD due to its 5V peak reverse voltage and nanoscale junction. Use Class 0 ESD controls: grounded workstations, ionizers, and conductive tweezers during die placement. Avoid triboelectric charging during handling—never use plastic trays or non-conductive probes. Perform assembly in a <100 V HBM environment and consider on-wafer testing before final integration. Post-assembly, apply a conformal coating to prevent moisture-induced leakage, even though the part is not moisture-sensitive, to protect bond wires and edges.

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