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06035J0R9BAWTR

Electronics Part Number

06035J0R9BAWTR-WX

Manufacturer

Pulse Electronics
06035J0R9BAWTR

Description

0.9pF 50V Thin Film Cap 0603, High Frequency

Inventory

453 Pcs New Original In Stock
0603 surface-mount thin film capacitor. 0.9pF, 50V. Very low capacitance, high accuracy. Suitable for RF matching and high-frequency compensation.
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Technical Specifications

Category Pulse Transformers

Manufacturer Pulse Electronics

Packaging Tape & Reel (TR)

Operating Temperature -40°C ~ 85°C

Mounting Type Surface Mount

Series HX5401NLT

Product Status Active

Size / Dimension 1.120" L x 0.680" W (28.45mm x 17.27mm)

Weight -

Height - Seated (Max) 0.440" (11.18mm)

Inductance 350µH

Transformer Type LAN 1G Base-T, Power over Ethernet (PoE)

ET (Volt-Time) -

Turns Ratio - Primary:Secondary 1CT:1CT

Data Sheet Document (D)

Datasheets Download HX5401NLT Product Specification (PDF)

HTML Datasheet HX5401NLT-DG

Environmental & Export Classification

RoHS Status ROHS3 Compliant

Moisture Sensitivity Level (MSL) 1 (Unlimited)

REACH Status REACH Unaffected

Additional Information

Other Names 553-HX5401NLTCT 553-HX5401NLTTR 553-HX5401NLTDKR

Standard Package 170

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Frequently Asked Questions (FAQ)

FAQ Icon

What are the key design risks when integrating the HX5401NLT into a 1000BASE-T Ethernet over PoE sys

When integrating the HX5401NLT in space-limited 1000BASE-T PoE designs, the primary risk is insufficient clearance and creepage distances due to its 28.45mm x 17.27mm footprint and 11.18mm seated height. Ensure proper keep-out zones for magnetics and signal integrity; avoid routing high-speed differential pairs too close to the transformer edges to prevent crosstalk. Use controlled impedance routing (100Ω differential) and ground stitching vias near the BGA pads to reduce EMI. Also, verify thermal performance under full PoE load, as limited copper area can restrict heat dissipation from internal windings. Pre-layout simulation and adherence to Pulse Electronics’ recommended footprint are critical to mitigate signal degradation and thermal issues.
FAQ Icon

Can the HX5401NLT replace the TE Connectivity LAN9514-i or the Broadcom BCM81111 integrated magnetic

The HX5401NLT can serve as a functional replacement for the TE Connectivity LAN9514-i and Broadcom BCM81111 in 1GBase-T PoE applications, but with important layout and compatibility considerations. While all three support 1:1 center-tapped ratios and PoE injection, the HX5401NLT uses a BGA footprint which differs significantly from some quad flat no-lead (QFN) alternatives, requiring PCB re-design. Verify pin compatibility for winding polarity and grounding schemes. Additionally, confirm that your PHY driver strength and common-mode choke selection are compatible with the HX5401NLT’s 350µH inductance, as deviations can impact signal integrity and EMI performance. Always test compliance with IEEE 802.3az and PoE standards (802.3af/at) after substitution.
FAQ Icon

What signal integrity challenges arise when using the HX5401NLT in high-density multilayer Ethernet

Using the HX5401NLT in high-density multilayer boards introduces risks of impedance mismatch, crosstalk, and ground bounce due to its BGA construction and high-frequency 1GBase-T signaling. To mitigate, maintain consistent 100Ω differential impedance across all layers by adjusting trace width and spacing relative to the dielectric. Avoid vias in the signal path between the PHY and HX5401NLT windings; if unavoidable, place them symmetrically. Use a solid ground plane beneath the transformer with multiple low-inductance ground connections via the BGA. Minimize stub lengths and ensure tight coupling between complementary traces. Consider back-drilling if using thick backplanes. Perform time-domain reflectometry (TDR) validation during prototyping to detect discontinuities.
FAQ Icon

How does the 350µH inductance of the HX5401NLT affect power-over-Ethernet (PoE) transient response a

The 350µH inductance of the HX5401NLT influences PoE Class 4 systems by affecting the rate of current rise during power-up and fault events. Higher inductance limits di/dt, which can reduce inrush current stress on PoE PSE controllers—beneficial for reliability—but may slow fault detection timing in short-circuit scenarios. Additionally, if not paired with proper common-mode chokes and filtering, the inductance can resonate with parasitic capacitances, leading to conducted noise in the 1–10 MHz range that interferes with data signals. To mitigate, use a low-Z0 common-mode choke matched to the HX5401NLT’s impedance profile and implement RC damping networks if oscillations are observed on power rails. Ensure PoE detection and classification timers on the PSE allow margin for transformer saturation effects.
FAQ Icon

What long-term reliability concerns should be evaluated when deploying the HX5401NLT in industrial E

Deploying the HX5401NLT in industrial environments near its 85°C upper temperature limit requires careful evaluation of thermal aging and insulation breakdown. While the HX5401NLT is rated for -40°C to 85°C operation, prolonged exposure at high ambient temperatures—especially under full PoE load—can accelerate insulation degradation in windings, risking short circuits or inductance drift. Ensure adequate PCB copper area for heat spreading and monitor hotspot temperature at the BGA interface; aim to keep internal winding temperature below 110°C. Avoid temperature cycling without conformal coating in humid environments, as moisture ingress combined with thermal stress may lead to electrochemical migration. Additionally, verify mechanical stability under vibration, as BGA joints are more brittle than leaded packages under sustained shock.
FAQ Icon

What are the key design risks when integrating the HX5401NLT into a 1000BASE-T Ethernet over PoE sys

When integrating the HX5401NLT in space-limited 1000BASE-T PoE designs, the primary risk is insufficient clearance and creepage distances due to its 28.45mm x 17.27mm footprint and 11.18mm seated height. Ensure proper keep-out zones for magnetics and signal integrity; avoid routing high-speed differential pairs too close to the transformer edges to prevent crosstalk. Use controlled impedance routing (100Ω differential) and ground stitching vias near the BGA pads to reduce EMI. Also, verify thermal performance under full PoE load, as limited copper area can restrict heat dissipation from internal windings. Pre-layout simulation and adherence to Pulse Electronics’ recommended footprint are critical to mitigate signal degradation and thermal issues.
FAQ Icon

Can the HX5401NLT replace the TE Connectivity LAN9514-i or the Broadcom BCM81111 integrated magnetic

The HX5401NLT can serve as a functional replacement for the TE Connectivity LAN9514-i and Broadcom BCM81111 in 1GBase-T PoE applications, but with important layout and compatibility considerations. While all three support 1:1 center-tapped ratios and PoE injection, the HX5401NLT uses a BGA footprint which differs significantly from some quad flat no-lead (QFN) alternatives, requiring PCB re-design. Verify pin compatibility for winding polarity and grounding schemes. Additionally, confirm that your PHY driver strength and common-mode choke selection are compatible with the HX5401NLT’s 350µH inductance, as deviations can impact signal integrity and EMI performance. Always test compliance with IEEE 802.3az and PoE standards (802.3af/at) after substitution.
FAQ Icon

What signal integrity challenges arise when using the HX5401NLT in high-density multilayer Ethernet

Using the HX5401NLT in high-density multilayer boards introduces risks of impedance mismatch, crosstalk, and ground bounce due to its BGA construction and high-frequency 1GBase-T signaling. To mitigate, maintain consistent 100Ω differential impedance across all layers by adjusting trace width and spacing relative to the dielectric. Avoid vias in the signal path between the PHY and HX5401NLT windings; if unavoidable, place them symmetrically. Use a solid ground plane beneath the transformer with multiple low-inductance ground connections via the BGA. Minimize stub lengths and ensure tight coupling between complementary traces. Consider back-drilling if using thick backplanes. Perform time-domain reflectometry (TDR) validation during prototyping to detect discontinuities.
FAQ Icon

How does the 350µH inductance of the HX5401NLT affect power-over-Ethernet (PoE) transient response a

The 350µH inductance of the HX5401NLT influences PoE Class 4 systems by affecting the rate of current rise during power-up and fault events. Higher inductance limits di/dt, which can reduce inrush current stress on PoE PSE controllers—beneficial for reliability—but may slow fault detection timing in short-circuit scenarios. Additionally, if not paired with proper common-mode chokes and filtering, the inductance can resonate with parasitic capacitances, leading to conducted noise in the 1–10 MHz range that interferes with data signals. To mitigate, use a low-Z0 common-mode choke matched to the HX5401NLT’s impedance profile and implement RC damping networks if oscillations are observed on power rails. Ensure PoE detection and classification timers on the PSE allow margin for transformer saturation effects.
FAQ Icon

What long-term reliability concerns should be evaluated when deploying the HX5401NLT in industrial E

Deploying the HX5401NLT in industrial environments near its 85°C upper temperature limit requires careful evaluation of thermal aging and insulation breakdown. While the HX5401NLT is rated for -40°C to 85°C operation, prolonged exposure at high ambient temperatures—especially under full PoE load—can accelerate insulation degradation in windings, risking short circuits or inductance drift. Ensure adequate PCB copper area for heat spreading and monitor hotspot temperature at the BGA interface; aim to keep internal winding temperature below 110°C. Avoid temperature cycling without conformal coating in humid environments, as moisture ingress combined with thermal stress may lead to electrochemical migration. Additionally, verify mechanical stability under vibration, as BGA joints are more brittle than leaded packages under sustained shock.

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